The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2018
Filed:
Dec. 18, 2015
Stmicroelectronics International N.v., Amsterdam, NL;
Stmicroelectronics, Inc., Coppell, TX (US);
Mahaveer Jain, Greater Noida, IN;
Mahesh Chowdhary, San Jose, CA (US);
STMicroelectronics, Inc., Coppell, TX (US);
STMicroelectronics International N.V., Schiphol, NL;
Abstract
A method includes acquiring magnetic data from a magnetometer, processing the magnetic data to perform robust calibration, and generating optimum calibration parameters using a calibration status indicator. To that end, the method includes generating a calibration status indicator as a function of time elapsed since a last calibration and variation in total magnetic field in previously stored magnetic data, detecting anomalies, and extracting a sparse magnetic data set using comparison between the previously stored magnetic data and the magnetic data. Calibration parameters are generated for the magnetometer using a calibration method as a function of the magnetic data set. The calibration parameters are stored based on performing a validation and stability check on the calibration parameters, and weighted with the previously stored calibration parameters to produce weighted calibration parameters. Calibration settings are generated as a function of the weighted calibration parameters, if the weighted calibration parameters were produced.