The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2018

Filed:

Apr. 23, 2015
Applicants:

Global Unichip Corporation, Hsinchu, TW;

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Shi-Hao Chen, Nantou County, TW;

Yung-Sheng Fang, Kaohsiung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31725 (2013.01); G01R 31/31718 (2013.01);
Abstract

A method for determining performance of an integrated circuit (IC) is disclosed herein. The method includes following operations: disposing hardware performance monitors (HPMs) in each of ICs, in which each of HPMs generates a value for generating the performance of the IC; providing a performance function including of terms according to values generated by the HPMs, in which a weight is associated with each of terms; determining the weight of each of terms according to a first set of ICs of the ICs, wherein the performance of each of the ICs is known; and determining the performance of a first ICs of the ICs according to the performance function, wherein the performance function and the weights are built into the first ICs.


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