The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Jan. 07, 2016
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Jin-Dah Chen, Hsin-Chu, TW;

Han-Wei Wu, Tainan, TW;

Ming-Feng Shieh, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/423 (2006.01); H01L 21/306 (2006.01); H01L 21/283 (2006.01); H01L 21/308 (2006.01); H01L 21/28 (2006.01); H01L 29/66 (2006.01); H01L 21/3213 (2006.01);
U.S. Cl.
CPC ...
H01L 29/4236 (2013.01); H01L 21/283 (2013.01); H01L 21/28088 (2013.01); H01L 21/3085 (2013.01); H01L 21/30604 (2013.01); H01L 29/66545 (2013.01); H01L 21/32139 (2013.01);
Abstract

A method of fabricating a semiconductor device includes forming a first, a second and a third trenches extending through a dielectric layer over a substrate, forming a material layer in the first, the second and the third trenches, forming a sacrificial layer to fully fill in the remaining first and the second trenches, recessing the sacrificial layer in the first trench and the second trench, recessing the material layer in the first trench and in the second trench. After recessing the material layer, a top surface of the remaining material layer is co-planar with a top surface of the remaining sacrificial layer in the first trench and a top surface of the remaining material layer is co-planar with a top surface of the remaining sacrificial layer in the second trench. The method also includes removing the remaining sacrificial layer in the first trench and the second trench.


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