The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Jul. 22, 2013
Applicant:

Applied Materials Israel Ltd., Rehovot, IL;

Inventors:

Gadi Greenberg, Tel Aviv, IL;

Idan Kaizerman, Meitar, IL;

Zeev Zohar, Migdal, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G05B 19/418 (2006.01); H01J 37/00 (2006.01); G06T 7/00 (2017.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41875 (2013.01); G06T 7/0004 (2013.01); H01J 37/00 (2013.01); G06T 2207/10061 (2013.01); G06T 2207/30148 (2013.01); H01L 22/20 (2013.01);
Abstract

Inspection apparatus includes an imaging module, which is configured to capture images of defects at different, respective locations on a sample. A processor is coupled to process the images so as to automatically assign respective classifications to the defects, and to autonomously control the imaging module to continue capturing the images responsively to the assigned classifications.


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