The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

Nov. 21, 2017
Applicant:

United Microelectronics Corp., Hsinchu, TW;

Inventors:

Chia-Lin Lu, Taoyuan, TW;

Chun-Lung Chen, Tainan, TW;

Kun-Yuan Liao, Hsinchu, TW;

Jiunn-Hsiung Liao, Tainan, TW;

Wei-Hao Huang, New Taipei, TW;

Kai-Teng Cheng, Kaohsiung, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 23/528 (2006.01); H01L 21/311 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76895 (2013.01); H01L 21/31105 (2013.01); H01L 21/7684 (2013.01); H01L 21/76802 (2013.01); H01L 21/76819 (2013.01); H01L 21/76877 (2013.01); H01L 23/5283 (2013.01); H01L 29/785 (2013.01); H01L 2029/7858 (2013.01);
Abstract

A method for fabricating a semiconductor device is provided including providing a substrate, on which a plurality of elements is formed. A first inter-dielectric layer is formed over the substrate, covering the elements. A first plug structure is formed in the first inter-dielectric layer, including performing a polishing process over the first inter-dielectric layer to have a dishing on top and extending from a sidewall of the first plug structure. A hard mask layer is formed to fill the dishing. A second inter-dielectric layer is formed over the hard mask layer. A second plug structure is formed in the second inter-dielectric layer to electrically contact the first plug structure, wherein the second plug structure has at least an edge portion extending on the hard mask layer.


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