The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Oct. 13, 2017
Applicant:

Macronix International Co., Ltd., Hsinchu, TW;

Inventors:

Po-Hao Tseng, Taichung, TW;

Yu-Yu Lin, New Taipei, TW;

Kai-Chieh Hsu, Taoyuan, TW;

Feng-Min Lee, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/00 (2006.01); H04L 9/32 (2006.01); G06F 21/73 (2013.01); H04L 9/08 (2006.01); G11C 13/00 (2006.01);
U.S. Cl.
CPC ...
H04L 9/3278 (2013.01); G06F 21/73 (2013.01); G11C 13/0059 (2013.01); H04L 9/0866 (2013.01); G06F 2212/1052 (2013.01); H04L 2209/12 (2013.01);
Abstract

A method for physically unclonable function-identification (PUF-ID) generation includes: providing a PUF array having programmable resistance memory cells; performing a forming procedure followed by a programming procedure on all of the programmable resistance memory cells of the PUF array; performing an estimation process to estimate randomness of the PUF array, by comparing a reference current of a base unit to a total current passing through all of the programmable resistance memory cells for obtaining a PUF randomness; determining a setting result of randomness based on the estimation process; and generating a PUF-ID according to the setting result of randomness.


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