The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2018
Filed:
Dec. 13, 2013
Freescale Semiconductor, Inc., Austin, TX (US);
NXP USA, INC., Austin, TX (US);
Abstract
A method and apparatus of validating a test pattern for at-speed testing of at least one integrated circuit, IC, design. The method comprises calculating at least one weighted rise activity, WRA, value for at least one region of the IC design based at least partly on rising gate transitions within the at least one region of the IC design when the test pattern is applied thereto, calculating at least one weighted fall activity, WFA, value for the at least one region of the IC design based at least partly on fall gate transitions within the at least one region of the IC design when the test pattern is applied thereto, and validating the test pattern based at least partly on the WRA value and the WFA value.