The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2018
Filed:
Aug. 20, 2014
Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;
Chin-Cheng Kuo, Taoyuan, TW;
Wei Min Chan, Sindian, TW;
Wei-Yu Hu, Zhubei, TW;
Jui-Feng Kuan, Zhubei, TW;
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., Hsinchu, TW;
Abstract
A method includes determining a sampling region in a sample space, generating samples in the sampling region without generating samples outside the sampling region, and simulating a performance of a device using the generated samples as input data. The sample space is defined by a plurality of variables associated with the device. Values of the plurality of variables in the sampling region having lower probabilities to meet a specification of the device than values of the plurality of variables outside the sampling region. The method is performed at least partially by at least one processor.