The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

Aug. 18, 2017
Applicant:

Shin-etsu Handotai Co., Ltd., Tokyo, JP;

Inventors:

Ryoji Hoshi, Nishigo-mura, JP;

Hiroyuki Kamada, Nishigo-mura, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/322 (2006.01); C30B 33/02 (2006.01); C30B 33/00 (2006.01); C01B 33/02 (2006.01); C30B 29/06 (2006.01); H01L 29/32 (2006.01); C30B 15/00 (2006.01);
U.S. Cl.
CPC ...
C30B 33/02 (2013.01); C01B 33/02 (2013.01); C30B 29/06 (2013.01); C30B 33/005 (2013.01); H01L 21/3221 (2013.01); H01L 29/32 (2013.01); C30B 15/00 (2013.01);
Abstract

A method for a heat treatment of a silicon single crystal wafer in an oxidizing ambient, including: performing the heat treatment based on a condition determined by a tripartite correlation between a heat treatment temperature during the heat treatment, an oxygen concentration in the silicon single crystal wafer before the heat treatment, and a growth condition of a silicon single crystal from which the silicon single crystal wafer is cut out. This provides a method for a heat treatment of a silicon single crystal wafer which can annihilate void defects or micro oxide precipitate nuclei in a silicon single crystal wafer with low cost, efficiently, and securely by a heat treatment in an oxidizing ambient.


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