The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2018
Filed:
Mar. 14, 2017
United Microelectronics Corp., Hsin-Chu, TW;
Fujian Jinhua Integrated Circuit Co., Ltd., Quanzhou, Fujian province, CN;
Feng-Yi Chang, Tainan, TW;
Fu-Che Lee, Taichung, TW;
Chien-Cheng Tsai, Kaohsiung, TW;
Feng-Ming Huang, Pingtung County, TW;
Hsien-Shih Chu, Kaohsiung, TW;
UNITED MICROELECTRONICS CORP., Hsin-Chu, TW;
Fujian Jinhua Integrated Circuit Co., Ltd., Quanzhou, Fujian province, CN;
Abstract
A manufacturing method of a semiconductor storage device includes forming a plurality of bit line structures on a semiconductor substrate and forming a plurality of storage node contacts disposed between the bit line structures. The method of forming the storage node contacts includes forming a plurality of conductive patterns on the semiconductor substrate followed by performing an etching back process to the conductive patterns for decreasing a thickness of the conductive patterns. The manufacturing method further includes forming a plurality of isolation patterns between the conductive patterns, wherein the isolation patterns are formed after forming the plurality of conductive patterns and before the etching back process. According to the present invention, the storage node contacts are formed by first forming the conductive patterns and then forming the isolation patterns between the conductive patterns, so as to simplify manufacturing process and increase process yield.