The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Jan. 13, 2017
Applicant:

United Microelectronics Corp., Hsin-Chu, TW;

Inventors:

Han Wang, Singapore, SG;

Xian Feng Du, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/11568 (2017.01); H01L 29/792 (2006.01); H01L 29/49 (2006.01);
U.S. Cl.
CPC ...
H01L 27/11568 (2013.01); H01L 29/4916 (2013.01); H01L 29/792 (2013.01);
Abstract

A semiconductor memory cell structure includes a substrate, a tunnel dielectric layer formed on the substrate, a blocking dielectric layer formed on the substrate, a control gate formed on the blocking dielectric layer, and a tri-layered charge-trapping layer sandwiched between the tunnel dielectric layer and the blocking dielectric layer. Furthermore, the tri-layered charge-trapping layer includes a bottom nitride layer formed on the substrate, a top nitride layer formed on the bottom nitride layer, and a middle nitride layer sandwiched between the bottom nitride layer and the top nitride layer. The bottom nitride layer includes a first nitride concentration, the top nitride layer includes a second nitride concentration, and the middle nitride layer includes a third nitride concentration. And the third nitride concentration is larger than the first nitride concentration and the second nitride concentration.


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