The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

May. 15, 2013
Applicant:

Canon, Inc., Ohta-ku, Tokyo, JP;

Inventors:

Takeshi Sakai, Sendai, JP;

Tatsuro Yoshida, Sendai, JP;

Ryosuke Hiratsuka, Sendai, JP;

Syun Ishikawa, Sendai, JP;

Assignee:

CANON, INC., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); C11D 11/00 (2006.01); H01L 21/67 (2006.01); H01L 21/02 (2006.01); H01L 21/306 (2006.01); B05D 1/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76814 (2013.01); B05D 1/00 (2013.01); C11D 11/0047 (2013.01); H01L 21/02057 (2013.01); H01L 21/306 (2013.01); H01L 21/30604 (2013.01); H01L 21/67017 (2013.01); H01L 21/67051 (2013.01); H01L 21/76831 (2013.01); H01L 21/76898 (2013.01);
Abstract

There is provided a method for processing an inner wall surface of a micro vacancy, capable of reliably etching or cleaning even if the hole provided to the substrate to be processed is narrow and deep. The substrate has a surface and a micro vacancy with an opening on the surface. An aspect ratio of the micro vacancy being at least 5, or the aspect ratio being less than 5 and a ratio of a micro vacancy volume to a surface area of the opening being at least 3. The micro vacancy is exposed to an atmosphere for forming a silicon oxide film so as to form a silicon oxide film on the inner wall surface of the micro vacancy. Subsequently a processing solution with a wettability with respect to silicon oxide is introduced into the micro vacancy so as to perform processing of the inner wall surface.


Find Patent Forward Citations

Loading…