The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2018
Filed:
Jul. 01, 2016
Mentor Graphics Corporation, Wilsonville, OR (US);
Valeriy Sukharev, Campbell, CA (US);
Xin Huang, Sunnyvale, CA (US);
Mentor Graphics Corporation, Wilsonville, OR (US);
Abstract
Aspects of the disclosed technology relate to techniques of full-chip assessment of time-dependent dielectric breakdown. A layout design is analyzed to identify matching patterns that match a pre-calculated pattern in a pattern database. Each of pre-calculated patterns in the pattern database has a time-to-failure characteristic value pre-computed based on a model of electric current path generation and evolution. Time-to-failure characteristic values are then determined for the matching patterns based on the pre-computed time-to-failure characteristic values and electric attributes of geometric elements in each of the matching patterns. Based on the time-to-failure characteristic values, matching patterns most susceptible to time-dependent dielectric breakdown are identified and fixed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile