Ziqing Li

Title: Ziqing Li: Innovator in Multi-Layer Film Measurement

Introduction

Ziqing Li is a notable inventor based in Xiamen, China. He has made significant contributions to the field of optical measurement, particularly in the analysis of multi-layer films. His innovative approach has led to the development of a unique method for measuring the thickness and optical properties of these films.

Latest Patents

Ziqing Li holds a patent for a method titled "Method for measuring thickness and optical properties of multi-layer film." This method involves several steps, including depositing films on a substrate to form a multi-layer film, measuring an ellipsometric spectrum, and obtaining optical constants and thickness based on the type of film layer. The process is designed to enhance the accuracy of measurements in optical applications.

Career Highlights

Ziqing Li is affiliated with Huaqiao University, where he continues to advance research in optical measurement techniques. His work has garnered attention for its practical applications in various industries, including materials science and engineering.

Collaborations

Ziqing Li collaborates with esteemed colleagues such as Changcai Cui and Jing Lu, who contribute to his research endeavors. Their combined expertise fosters a productive environment for innovation and discovery.

Conclusion

Ziqing Li's contributions to the field of optical measurement through his patented method exemplify the importance of innovation in advancing technology. His work at Huaqiao University and collaborations with fellow researchers highlight the collaborative spirit of scientific inquiry.