Chicago, IL, United States of America

Zheng Zhang


Average Co-Inventor Count = 5.2

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2019-2023

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5 patents (USPTO):Explore Patents

Title: Zheng Zhang: Innovator in Multi-Spectral X-Ray Tomography

Introduction

Zheng Zhang is a prominent inventor based in Chicago, IL (US). He has made significant contributions to the field of imaging technology, particularly in the development of multi-spectral X-ray tomography systems. With a total of 5 patents to his name, his work continues to influence advancements in medical imaging.

Latest Patents

One of Zheng Zhang's latest patents is a system and method for low-dose multi-spectral X-ray tomography. This innovative imaging system includes one or more source devices that direct beams of radiation in multiple spectra to a region of interest (ROI). Additionally, it features one or more detectors that receive these beams of radiation. The system is equipped with a processor that facilitates movement in at least one of the components, allowing a first beam of radiation with a first spectrum to be directed to the ROI for less than 360 degrees of movement. The processor also processes data detected by the detectors, generating an image of the ROI based on the processed data.

Career Highlights

Zheng Zhang has worked with notable organizations, including the University of Chicago and Canon Medical Systems Corporation. His experience in these institutions has allowed him to refine his skills and contribute to groundbreaking research in imaging technologies.

Collaborations

Zheng has collaborated with esteemed colleagues such as Xiaochuan Pan and Dan Xia. These partnerships have further enhanced his research and development efforts in the field of multi-spectral imaging.

Conclusion

Zheng Zhang's innovative work in multi-spectral X-ray tomography exemplifies the impact of his inventions on medical imaging technology. His contributions continue to pave the way for advancements in this critical field.

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