Beijing, China

Zhen Tan


 

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018

where 'Filed Patents' based on already Granted Patents

1 patent (USPTO):

Title: Zhen Tan - Innovator in Aircraft Inspection Technologies.

Introduction

Zhen Tan is a notable inventor based in Beijing, China. He has made significant contributions to the field of aircraft inspection technologies. His innovative approach has led to the development of a unique system that enhances the safety and efficiency of aircraft inspections.

Latest Patents

Zhen Tan holds a patent for "Systems and methods for inspecting an aircraft." This patent describes a system that utilizes an X-ray/Gamma ray radiation source and a detector positioned above and below the fuselage of an aircraft. The radiation source emits a beam that passes through the aircraft, allowing the detector to receive and convert the radiation into an output signal. This system generates a vertical transmission image in real time, providing crucial data for aircraft inspections. He has 1 patent to his name.

Career Highlights

Throughout his career, Zhen Tan has worked with prestigious organizations, including Tsinghua University and Nuctech Company Limited. His experience in these institutions has allowed him to refine his skills and contribute to advancements in technology.

Collaborations

Zhen Tan has collaborated with notable colleagues such as Kejun Kang and Jianmin Li. Their combined expertise has furthered the development of innovative solutions in the field of aircraft inspection.

Conclusion

Zhen Tan's contributions to aircraft inspection technologies demonstrate his commitment to innovation and safety in aviation. His work continues to influence the industry and pave the way for future advancements.

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