Stanford, CA, United States of America

Yue Ma


Average Co-Inventor Count = 4.2

ph-index = 2

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2018-2019

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2 patents (USPTO):Explore Patents

Title: Innovations of Yue Ma: Pioneering Advances in Memory and Sensor Technologies

Introduction

Yue Ma is an accomplished inventor based in Stanford, California, known for her significant contributions to the fields of memory and sensor technologies. With a total of two patents to her name, she has developed innovative solutions that enhance the functionality and efficiency of electronic devices.

Latest Patents

Yue Ma's latest patents include a "Metallic-magnetic-domain-wall-based nonvolatile tunable resistor for memory and sensor applications." This invention allows for control of electrical conductivity through electrically conductive magnetic domain walls, enabling alterations in electrical resistance based on the configuration of magnetic domains. Such advancements have potential applications in non-volatile information storage and sensor technologies. Another notable patent is the "Microwave impedance microscopy using a tuning fork." This invention features a microwave impedance microscope that utilizes a high-aspect ratio etched metal tip electrode to reduce parasitic capacitance, enhancing the precision of microwave signal measurements.

Career Highlights

Throughout her career, Yue Ma has worked with prestigious institutions, including Leland Stanford Junior University and Riken Corporation. Her work has significantly impacted the development of advanced materials and devices, showcasing her expertise in the field.

Collaborations

Yue Ma has collaborated with notable colleagues, including Yongtao Cui and Zhixun Shen, contributing to various research projects that push the boundaries of technology.

Conclusion

Yue Ma's innovative patents and career achievements highlight her role as a leading inventor in the realm of memory and sensor technologies. Her work continues to inspire advancements in electronic device functionality and efficiency.

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