Yuan-Fa Lee

Title: Innovations by Yuan-Fa Lee

Introduction

Yuan-Fa Lee is a notable inventor based in Tainan, Taiwan. He has made significant contributions to the field of sample classification technology. His innovative work has led to the development of a unique patent that enhances the efficiency of sample classification processes.

Latest Patents

Yuan-Fa Lee holds a patent for a "Sample classification device, sample classification system, and sample classification method." This invention includes a sample classification device featuring a carrier, a first detection module, and a sample pipeline. The first detection module consists of a first light-emitting device, a second light-emitting device, and a first optical sensing device. The first light-emitting device emits light of a first wavelength, while the second light-emitting device emits light of a second wavelength, which is different from the first. The first optical sensing device is strategically placed between the two light-emitting devices, and the sample pipeline is positioned above the carrier, passing over the first optical sensing device.

Career Highlights

Yuan-Fa Lee is affiliated with the Industrial Technology Research Institute, where he continues to innovate and develop new technologies. His work at this esteemed institution has allowed him to focus on advancing sample classification methods and devices.

Collaborations

Yuan-Fa Lee has collaborated with notable colleagues, including Chih-Hung Huang and Miao-Chang Wu. Their combined expertise contributes to the advancement of technology in their field.

Conclusion

Yuan-Fa Lee's contributions to sample classification technology exemplify the impact of innovative thinking in research and development. His patent reflects a commitment to enhancing efficiency in scientific processes.