Yu-Wei Tseng

Title: Innovations of Yu-Wei Tseng in Memory Device Testing

Introduction

Yu-Wei Tseng is a notable inventor based in New Taipei, Taiwan. He has made significant contributions to the field of memory device testing, showcasing his expertise through his innovative patent.

Latest Patents

Yu-Wei Tseng holds a patent for a "Test apparatus and test method to a memory device." This patent describes a test system that includes a tester, a first voltage stabilization circuit, and a device under test (DUT). The tester generates a first operational voltage and a control signal. The first voltage stabilization circuit transmits a second operational voltage, associated with the first operational voltage, to a socket board. The DUT operates with the second operational voltage received through the socket board. Additionally, the first voltage stabilization circuit is configured to control, according to the control signal, the second operational voltage to have a first voltage level when the DUT is operating.

Career Highlights

Yu-Wei Tseng is currently employed at Nan Ya Technology Corporation, where he continues to develop and refine technologies related to memory devices. His work has been instrumental in advancing testing methodologies in this field.

Collaborations

Some of his coworkers include Chih-Ming Chang and Wan-Chun Fang, who contribute to the innovative environment at Nan Ya Technology Corporation.

Conclusion

Yu-Wei Tseng's contributions to memory device testing through his patent demonstrate his commitment to innovation and excellence in technology. His work continues to influence the industry positively.