Young Kyum Ahn

Title: Young Kyum Ahn: Innovator in Micro Cantilever Technology

Introduction

Young Kyum Ahn is a notable inventor based in Kyunggi-do, South Korea. He has made significant contributions to the field of micro cantilever technology, particularly in the area of wafer probing. His innovative approach has led to the development of a unique probe design that enhances the efficiency and durability of inspection processes.

Latest Patents

Young Kyum Ahn holds a patent for a micro cantilever-style contact pin structure for wafer probing. This invention provides a micro cantilever-type probe that is designed to have appropriate elasticity and mechanical strength. The probe is capable of recovering its unforced shape after deformation during inspections and can maintain its original shape even after three hundred thousand uses. The patent outlines a probe card that includes an electrically insulated substrate fixed on a circuit board, a plurality of elastic probes with sharpened ends, and wiring formed on the probe, insulated substrate, and circuit board. The manufacturing process involves patterning a substrate using photolithography and etching to create the desired probe structure, which is then coated with metal layers.

Career Highlights

Young Kyum Ahn is associated with Amst Company Limited, where he continues to innovate and develop advanced technologies. His work has significantly impacted the field of semiconductor testing and inspection.

Collaborations

Some of his notable coworkers include Dong Il Kim and Sam Won Chung, who contribute to the collaborative efforts at Amst Company Limited.

Conclusion

Young Kyum Ahn's contributions to micro cantilever technology exemplify the spirit of innovation in the field of wafer probing. His patented designs not only enhance the efficiency of inspections but also ensure longevity in performance.