Young K Lee

Title: Young K Lee - Innovator in Charged Particle Scanning Technology

Introduction

Young K Lee is a prominent inventor based in San Diego, CA. He has made significant contributions to the field of charged particle scanning technology. His innovative work focuses on enhancing security and safety through advanced scanning systems.

Latest Patents

Young K Lee holds a patent for a volume interrogation system that utilizes an accelerated beam of charged particles. This system is designed to interrogate objects by employing charged-particle attenuation and scattering tomography. It is particularly useful for screening items such as portable electronic devices, packages, baggage, industrial products, and food products for the presence of materials of interest. The systems and methods outlined in his patent can be effectively employed in checkpoint applications, including border crossings and mass transit terminals.

Career Highlights

Young K Lee is associated with Decision Sciences International Corporation, where he applies his expertise in developing advanced scanning technologies. His work has been instrumental in improving security measures across various sectors.

Collaborations

He has collaborated with notable colleagues, including Robert David Penny and Michael James Sossong, to further enhance the capabilities of their scanning technologies.

Conclusion

Young K Lee's contributions to charged particle scanning technology exemplify his commitment to innovation and safety. His work continues to impact various industries by providing advanced solutions for security screening.