Company Filing History:
Years Active: 2004-2005
Title: Young-Jin Wee: Innovator in Integrated Circuit Testing
Introduction
Young-Jin Wee is a notable inventor based in Kyunggi-do, South Korea. He has made significant contributions to the field of integrated circuit testing, holding a total of 3 patents. His work focuses on enhancing the reliability of interconnections in integrated circuits, which is crucial for the advancement of electronic devices.
Latest Patents
Young-Jin Wee's latest patents include innovative apparatuses designed for testing the reliability of interconnections in integrated circuits. One of his inventions involves a comb-like pattern and a serpentine-like pattern that work together to test leakage protection reliability. This apparatus is equipped with means to apply bias to the patterns, forming a maximum field region around a via. The design allows for effective identification of failure spots, such as leakage or shorts, by generating multiple weak field regions.
Another patent by Young-Jin Wee also focuses on testing leakage current protection reliability. This apparatus features a comb-like pattern composed of multiple tooth portions and vias, along with a serpentine-like pattern that includes various connection parts. The unique arrangement of these components enables the apparatus to effectively generate potential differences, facilitating the detection of failures in integrated circuits.
Career Highlights
Young-Jin Wee is currently employed at Samsung Electronics Co., Ltd., where he continues to innovate in the field of integrated circuits. His work has been instrumental in improving the reliability and performance of electronic devices, making significant strides in the industry.
Collaborations
Throughout his career, Young-Jin Wee has collaborated with talented individuals such as Won-sang Song and Jung-Woo Kim. These collaborations have contributed to the development of advanced technologies in integrated circuit testing.
Conclusion
Young-Jin Wee is a prominent inventor whose work in integrated circuit testing has led to valuable innovations. His patents reflect a commitment to enhancing the reliability of electronic devices, making him a key figure in the field.