Young Goun Lee

Title: Young Goun Lee: Innovator in Microfluidic Technology

Introduction

Young Goun Lee is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of microfluidic devices, holding a total of 2 patents. His work focuses on enhancing the reliability and efficiency of testing apparatuses used in various applications.

Latest Patents

One of his latest patents is a system configured to detect a pattern on a microfluidic device and determine that the microfluidic device has not been normally loaded in a test apparatus. This innovative test apparatus is designed for rapidly detecting abnormal loading of a microfluidic device, which helps prevent contamination of the test apparatus by a sample and degradation in the reliability of test results. The apparatus includes an optical sensor that photographs an image corresponding to the microfluidic device. A controller then detects a pattern formed on the surface of the microfluidic device based on the photographed image. It determines whether the characteristics of the detected pattern match those of a pre-stored pattern, thus identifying any abnormal loading.

Another notable patent is for a test platform, test apparatus, and control method thereof. This test platform is intended for testing a detection module of a test apparatus to ascertain whether correction is needed or for quality control of the test apparatus. The platform includes a body and at least one reference material, which is formed on the body and printed with at least one color.

Career Highlights

Young Goun Lee has worked with notable companies such as Nexus Dx, Inc. and Samsung Electronics Co., Ltd. His experience in these organizations has contributed to his expertise in developing advanced testing technologies.

Collaborations

Throughout his career, Young Goun Lee has collaborated with talented individuals, including Jung Tae Lee and Chung Ung Kim. These collaborations have fostered innovation and the development of cutting-edge solutions in the field of microfluidics.

Conclusion

Young Goun Lee is a distinguished inventor whose work in microfluidic technology has led to significant advancements in testing apparatuses. His patents reflect a commitment to improving the reliability and efficiency of testing methods, making a lasting impact in the field.