Company Filing History:
Years Active: 2024
Title: You-Wei Li: Innovator in Total Internal Reflection Scattering Measurement
Introduction
You-Wei Li is a notable inventor based in Yilan County, Taiwan. He has made significant contributions to the field of optical measurement technology. His innovative work focuses on enhancing measurement techniques through advanced devices.
Latest Patents
You-Wei Li holds a patent for a "Device and method for performing total internal reflection scattering measurement." This invention discloses a device that includes a first reflective plate with a first opening and a second reflective plate with second and third openings. The design allows for a slot to accommodate a sample slide, where a white light source illuminates the sample for TIRS measurement. This innovative approach aims to improve the accuracy and efficiency of optical measurements.
Career Highlights
You-Wei Li is affiliated with Chung Yuan Christian University, where he continues to advance his research and development in optical technologies. His work has garnered attention for its practical applications in various scientific fields.
Collaborations
You-Wei Li collaborates with esteemed colleagues, including Cheng-An J Lin and Tzu-Yin Hou. Their combined expertise contributes to the advancement of measurement technologies and enhances the research output of their institution.
Conclusion
You-Wei Li's contributions to the field of total internal reflection scattering measurement exemplify the impact of innovative thinking in scientific research. His patent and ongoing work at Chung Yuan Christian University highlight the importance of advancements in optical measurement technology.