Location History:
- Suwon, KR (2003)
- Suwon-si, KR (2009)
Company Filing History:
Years Active: 2003-2009
Title: You-Jong Kim: Innovator in Electron Emission Technology
Introduction
You-Jong Kim is a prominent inventor based in Suwon-si, South Korea. He has made significant contributions to the field of electron emission devices, holding a total of 3 patents. His work focuses on enhancing the efficiency and functionality of electron emission technologies.
Latest Patents
One of his latest patents is an "Electron emission device with improved electron emission structure for increasing emission efficiency and lowering driving voltage." This invention features first and second substrates that face each other, with cathode electrodes and electron emission regions strategically placed to optimize performance. The design includes gate electrodes that enhance the emission efficiency while reducing the required driving voltage.
Another notable patent is the "Electron emission device with enhanced focusing electrode structure." This device comprises first and second substrates, with electrodes insulated from each other. The innovative focusing electrode design allows for better control of electron beams, improving the overall functionality of the device.
Career Highlights
You-Jong Kim is currently employed at Samsung SDI Co., Inc., where he continues to develop cutting-edge technologies in the field of electron emission. His work has been instrumental in advancing the capabilities of electronic devices, making them more efficient and effective.
Collaborations
Throughout his career, You-Jong Kim has collaborated with notable colleagues, including Sung-Ho Jo and Sang-Jo Lee. These partnerships have fostered innovation and contributed to the successful development of various technologies.
Conclusion
You-Jong Kim is a key figure in the realm of electron emission technology, with a focus on improving device efficiency and performance. His contributions through patents and collaborations highlight his commitment to innovation in this critical field.