Kawaguchi, Japan

Yoshiyuki Sakairi


Average Co-Inventor Count = 1.3

ph-index = 2

Forward Citations = 23(Granted Patents)


Location History:

  • Tokyo, JP (2001 - 2003)
  • Kanagawa, JP (2003)
  • Kawaguchi, JP (2004)

Company Filing History:


Years Active: 2001-2004

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4 patents (USPTO):Explore Patents

Title: Innovations of Yoshiyuki Sakairi

Introduction

Yoshiyuki Sakairi is a notable inventor based in Kawaguchi, Japan. He has made significant contributions to the field of optical technology, holding a total of 4 patents. His work focuses on enhancing the efficiency and accuracy of optical measurements.

Latest Patents

Sakairi's latest patents include an optical fiber characteristic measuring device. This device comprises a coherent light supply device, a light pulse generating device, a wave mixing device, an opto-electrical converting device, and a processing device. The design ensures that the components have frequency characteristics corresponding to low-frequency components, which helps reduce circuit costs. Another significant patent is the light wavelength dispersion measuring apparatus and method. This apparatus features three band-pass filters connected in parallel, allowing for simultaneous phase difference measurement of the nth-order harmonics. This innovation significantly shortens the measurement time for wavelength dispersion characteristics.

Career Highlights

Yoshiyuki Sakairi is currently employed at Ando Electric Company, where he continues to develop cutting-edge optical technologies. His work has been instrumental in advancing the capabilities of optical measurement devices.

Collaborations

Sakairi has collaborated with notable colleagues, including Haruyoshi Uchiyama and Takao Minami. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Yoshiyuki Sakairi's contributions to optical technology through his patents and collaborations highlight his role as an influential inventor in the field. His innovations continue to pave the way for advancements in optical measurement techniques.

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