Maruko-machi, Japan

Yoshinori Wada



Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Innovations of Yoshinori Wada

Introduction

Yoshinori Wada is a notable inventor based in Maruko-machi, Japan. He has made significant contributions to the field of pressure measurement technology. His innovative approach has led to the development of a unique system that enhances the reliability and performance of pressure measurement devices.

Latest Patents

Wada holds 1 patent for his invention titled "System and method for pressure measurement." This patent describes a pressure measurement system that incorporates a circuit board housing to improve manufacturing efficiency and operational reliability. The system includes a pressure inlet joint, a pressure detecting component, and a circuit board that conditions the electrical signal from the pressure detecting component. The design of the circuit board housing is particularly noteworthy, as it features a cylindrical shape with distinct diameter sections, optimizing the integration of the pressure detecting component and circuit board.

Career Highlights

Yoshinori Wada is currently associated with Ashcroft-Nagano, Inc., where he continues to innovate in the field of pressure measurement. His work has been instrumental in advancing the technology used in various applications, ensuring that pressure measurement systems are both effective and efficient.

Collaborations

Wada has collaborated with several talented individuals in his field, including Yoshikazu Kaneko and Shuji Shimada. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge technologies.

Conclusion

Yoshinori Wada's contributions to pressure measurement technology exemplify the spirit of innovation. His patent and ongoing work at Ashcroft-Nagano, Inc. highlight his commitment to enhancing the performance and reliability of measurement systems.

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