Location History:
- Nagoya, JP (1984 - 1985)
- Age, JP (1989 - 1991)
- Mie, JP (1989 - 1991)
- Mie-ken, JP (1999)
Company Filing History:
Years Active: 1984-1999
Title: Innovations of Yoshinori Bessho
Introduction
Yoshinori Bessho is a notable inventor based in Mie, Japan. He has made significant contributions to the field of optical technology, holding a total of 11 patents. His work focuses on innovative methods and apparatuses that enhance the detection and scanning of surfaces.
Latest Patents
Among his latest patents is an optical scanner that features a magnet integrally formed with a mirror surface for reflecting a laser beam. This design incorporates a torsion spring made of a shape-memory alloy to hold the magnet in place. A coil generates an alternating magnetic field, allowing the magnet to oscillate about the torsion spring, which in turn scans the light beam. Another significant patent involves a method and apparatus for detecting surface conditions. This technology utilizes a converged light beam reflected off a subject surface to measure its roughness or undulation. The system controls the relative position between the object lens and the subject surface, ensuring that the reflected measuring light has a plane wave. The detection of surface conditions is based on the relative displacement between the object lens and the subject surface.
Career Highlights
Yoshinori Bessho is currently employed at Brother Industries, Ltd., where he continues to innovate and develop new technologies. His work has been instrumental in advancing optical scanning techniques and surface detection methods.
Collaborations
He has collaborated with notable coworkers, including Motohito Hino and Kazuhiko Fujita, contributing to various projects that enhance the capabilities of optical technologies.
Conclusion
Yoshinori Bessho's contributions to optical technology through his patents and collaborations highlight his role as a leading inventor in his field. His innovative approaches continue to influence advancements in surface detection and scanning technologies.