Location History:
- Miyanohigashi-machi, JP (2001)
- Kyoto, JP (2006)
Company Filing History:
Years Active: 2001-2006
Title: Innovations by Yoshihito Yuhara
Introduction
Yoshihito Yuhara is a notable inventor based in Kyoto, Japan. He has made significant contributions to the field of measurement technologies, particularly in solutions and semiconductor cleaning fluids. With a total of 2 patents, Yuhara's work reflects a commitment to advancing scientific methodologies.
Latest Patents
Yuhara's latest patents include a "Measuring method of component concentration in solution." This innovative method determines component concentration by calculating values at various temperatures with minimal steps. The process utilizes a solution absorbance spectrum and solvent absorbance spectrum at multiple wavelengths to measure concentration at an arbitrary temperature T. A calibration coefficient M(T) is pre-determined to facilitate accurate measurements.
Another significant patent is the "Fluid fine particle measuring system for processing semiconductors." This system is designed for cleaning fluid used in semiconductor applications. It features a sample tank, a pump for circulation, and a return conduit connected to a filter. The system effectively eliminates bubbles that could interfere with fine particle measurements, ensuring precise results.
Career Highlights
Yuhara is currently employed at Horiba, Ltd., a company renowned for its analytical and measuring instruments. His work at Horiba has allowed him to develop and refine his innovative technologies, contributing to the company's reputation in the industry.
Collaborations
Yuhara has collaborated with notable colleagues such as Riichiro Suzuki and Issei Yokoyama. These partnerships have fostered a collaborative environment that enhances the development of innovative solutions.
Conclusion
Yoshihito Yuhara's contributions to measurement technologies exemplify his dedication to innovation. His patents reflect a deep understanding of complex scientific principles and a commitment to improving measurement accuracy in various applications.