Company Filing History:
Years Active: 2004-2008
Title: Yoon-Gi Kim: Innovator in Optical Data Storage Technology
Introduction
Yoon-Gi Kim is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of optical data storage technology. With a total of 4 patents to his name, Kim's work has advanced the capabilities of data storage systems.
Latest Patents
One of his latest patents is titled "Near-field optical storage medium and optical data storage system therefor." This innovative optical data storage system utilizes an optical pickup that includes a solid immersion optical system or a solid immersion lens. It generates a near-field and emits a light beam to write or read information from an optical storage medium. The optical storage medium features a recording layer formed on a surface of an optical transmissive layer. This layer is designed to be thicker than one wavelength of the light beam, ensuring optimal performance. The system minimizes noise by controlling the interval between the solid immersion lens and the optical transmissive layer. Additionally, the design allows for effective data retrieval even in the presence of dust or damage on the optical storage medium.
Career Highlights
Yoon-Gi Kim is currently employed at Samsung Electronics Co., Ltd., where he continues to innovate in the field of optical technologies. His work has been instrumental in enhancing the efficiency and reliability of optical data storage systems.
Collaborations
Throughout his career, Kim has collaborated with notable colleagues, including Chul-Woo Lee and Kun-Ho Cho. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Yoon-Gi Kim's contributions to optical data storage technology exemplify his commitment to innovation. His patents reflect a deep understanding of the complexities involved in data storage systems. As he continues to work at Samsung Electronics, his future endeavors are likely to further advance this critical field.