Company Filing History:
Years Active: 2009-2014
Title: Innovations by Yong Joo Puah in 3-D Vision Inspection Technology
Introduction
Yong Joo Puah is a notable inventor based in Singapore, recognized for his contributions to the field of electronic component inspection. He holds two patents that showcase his innovative approaches to 3-dimensional vision and inspection technologies.
Latest Patents
One of his latest patents is titled "Method and apparatus for 3-dimensional vision and inspection of ball and like protrusions of electronic components." This patent describes a method for 3-dimensional vision inspection of objects, particularly microelectronic components with protrusions such as input/output contact balls. The method involves determining the interior and exterior parameters of a stereo camera system, forming a rectified stereo camera system, and capturing images of the object to measure the location, co-planarity, and height of the protrusions.
Another significant patent is the "System for 2-D and 3-D vision inspection." This invention combines 2-D and 3-D inspection of electronic device components into a compact module. The system includes a 2-D image acquisition assembly and a 3-D image acquisition assembly, along with a computer for control and data analysis. The 3-D image acquisition assembly utilizes a laser light source to generate a planar sheet of light, enhancing the inspection process.
Career Highlights
Yong Joo Puah is currently employed at Generic Power Pte Ltd, where he continues to develop innovative solutions in the field of electronic component inspection. His work has significantly advanced the capabilities of inspection systems, making them more efficient and effective.
Collaborations
He has collaborated with notable coworkers, including Hak Wee Tang and Soon Poo Teo, contributing to the development of cutting-edge technologies in their field.
Conclusion
Yong Joo Puah's contributions to 3-D vision inspection technology reflect his commitment to innovation and excellence in the field of electronic components. His patents demonstrate a significant advancement in inspection methodologies, paving the way for future developments in this area.