Yong Duan

Title: Innovations of Yong Duan in Eddy Current Thermography

Introduction

Yong Duan is a notable inventor based in Sichuan, China. He has made significant contributions to the field of thermography through his innovative methods. His work focuses on enhancing defect reconstruction techniques, which are crucial in various industrial applications.

Latest Patents

Yong Duan holds a patent for a "Method for eddy current thermography defect reconstruction based on electrical impedance tomography." This invention provides a systematic approach to identifying and quantifying defects in materials. The method involves obtaining a thermal reference image by acquiring a thermogram sequence during the heating process. It then creates a current matrix and a magnetic potential matrix to calculate the conductivity distribution through iterations. Ultimately, this leads to the reconstruction of an image that highlights defect profiles based on low conductivity areas.

Career Highlights

Yong Duan is affiliated with the University of Electronic Science and Technology of China. His academic background and research focus have positioned him as a key figure in the field of electrical engineering and thermography. His innovative methods have the potential to improve the accuracy and efficiency of defect detection in various materials.

Collaborations

Yong Duan has collaborated with notable colleagues, including Libing Bai and Xu Zhang. Their combined expertise contributes to advancing research in thermography and related fields.

Conclusion

Yong Duan's contributions to eddy current thermography represent a significant advancement in defect reconstruction methods. His innovative approach not only enhances the accuracy of defect detection but also showcases the importance of research in engineering applications.