Yokohama, Japan

Yoko Suzuki


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 33(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Yoko Suzuki to X-ray Inspection Technology

Introduction: Yoko Suzuki, a talented inventor based in Yokohama, Japan, has made significant strides in the field of X-ray inspection technology. Her innovative work at Hitachi, Ltd. demonstrates her commitment to advancing methods that enhance the quality and efficiency of manufacturing processes, specifically in the fabrication of multi-layer printed circuit boards.

Latest Patents: Yoko Suzuki holds a patent for an X-ray inspection method and apparatus. This invention involves an X-ray inspection apparatus that irradiates objects with characteristic X-rays, ensuring that at least one wavelength provides high X-ray absorbance. The transmitted X-ray image, which passes through the object, is analyzed to inspect the object based on the detected image. This groundbreaking method is crucial for producing reliable multi-layer printed circuit boards, which are essential components in modern electronic devices.

Career Highlights: Throughout her career at Hitachi, Ltd., Yoko Suzuki has exemplified innovation and technological advancement. Her focus on enhancing inspection methods underscores her expertise and her impact on the research and development landscape within the electronics industry.

Collaborations: Yoko has collaborated with esteemed colleagues such as Hideaki Doi and Yasuhiko Hara. Their teamwork has led to significant developments in inspection technologies, fostering an environment of creativity and innovation at Hitachi, Ltd.

Conclusion: Yoko Suzuki's contributions to X-ray inspection technology represent a vital advance in the quality assurance processes of electronic manufacturing. Her dedication to innovation and collaboration continues to inspire future developments in the field. As the industry evolves, her patented methods will likely play a pivotal role in ensuring the reliability and functionality of electronic devices worldwide.

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