Seoul, South Korea

Yoen-joo Kim


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 178(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Yoen-joo Kim

Introduction

Yoen-joo Kim is a notable inventor based in Seoul, South Korea. He has made significant strides in the field of noninvasive medical measurements. His work focuses on utilizing advanced technology to improve healthcare outcomes.

Latest Patents

Yoen-joo Kim holds a patent for a method and device for noninvasive measurements of concentrations of blood components. This innovative device employs a pulsed polychromatic light source that emits light in the near-infrared range of 800-1850 nm. The light interacts with a part of a patient's body, either through back scattering or transmission. The back scattered light from blood-containing tissues provides valuable information regarding blood component concentrations. The device is designed to minimize surface reflection and the effects of changes in the scattering background. Concentrations of blood components are calculated through spectral analysis based on selected wavelengths using a defined algorithm. A microprocessor processes this data, comparing it with a calibration curve stored in its memory, and displays the calculated concentration values.

Career Highlights

Yoen-joo Kim is currently employed at Samsung Electronics Co., Ltd., where he continues to innovate and develop new technologies. His work has contributed to advancements in medical devices that enhance patient care and monitoring.

Collaborations

Yoen-joo Kim collaborates with talented colleagues, including Airat K Amerov and Kye-jin Jeon. Their combined expertise fosters an environment of innovation and creativity.

Conclusion

Yoen-joo Kim's contributions to the field of noninvasive medical measurements exemplify the impact of innovative thinking in healthcare technology. His patent reflects a commitment to improving patient outcomes through advanced measurement techniques.

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