Company Filing History:
Years Active: 2022
Title: Yizhou Xia: Innovator in Heterodyne Grating Interferometry
Introduction
Yizhou Xia is a prominent inventor based in Beijing, China. He has made significant contributions to the field of interferometry, particularly with his innovative designs that enhance measurement precision and range.
Latest Patents
Yizhou Xia holds a patent for a "Five-degree-of-freedom heterodyne grating interferometry system." This system includes a single frequency laser device and an acousto-optic modulator. The laser device emits a single frequency laser that is coupled through optical fiber and split to enter the acousto-optic modulator. This process generates two linearly polarized lights of different frequencies, one serving as reference light and the other as measurement light. The system also features an interferometer lens group and a measurement grating, which work together to form measurement and compensation interference signals. The design boasts high measurement precision, a large measurement range, and minimal sensitivity to temperature drift, making it suitable for ultra-precision workpiece table position measurement systems.
Career Highlights
Yizhou Xia is affiliated with Tsinghua University, where he continues to advance research in optical measurement systems. His work has garnered attention for its practical applications in various high-precision fields.
Collaborations
Yizhou has collaborated with notable colleagues, including Yu Zhu and Ming Lei Zhang, contributing to the advancement of their shared research interests.
Conclusion
Yizhou Xia's innovative contributions to the field of interferometry exemplify the impact of dedicated research and development in enhancing measurement technologies. His work continues to influence the landscape of optical engineering and precision measurement systems.