Company Filing History:
Years Active: 2025
Title: Yishay Klein: Innovator in Chemical Element Mapping
Introduction
Yishay Klein is a notable inventor based in Amatzia, Israel. He has made significant contributions to the field of chemical element mapping through his innovative patent. His work focuses on enhancing measurement systems that determine the spatial distribution of chemical elements in various samples.
Latest Patents
Yishay Klein holds a patent for a "System and method for mapping chemical elements in a sample." This measurement system is designed to determine the spatial distribution of chemical elements by utilizing a measurement unit and a control system. The measurement unit produces primary radiation with spectral characteristics that excite multiple chemical elements in the sample, inducing secondary radiation responses. The system generates spectral measured data that indicates the intensity of these detected responses. The primary radiation interacts with the sample through a sequence of encoded radiation patterns, each with a predetermined spatial intensity pattern. The measured spectral data is characterized by sparsity in the spectral domain concerning each spectral component of the secondary radiation response. He has 1 patent to his name.
Career Highlights
Yishay Klein is affiliated with Bar-Ilan University, where he continues to advance his research and development in the field of chemical mapping. His work has implications for various scientific and industrial applications, enhancing the understanding of material compositions.
Collaborations
Yishay collaborates with Sharon Shwartz, contributing to the innovative research environment at Bar-Ilan University. Their partnership exemplifies the collaborative spirit in scientific research.
Conclusion
Yishay Klein's contributions to the field of chemical element mapping through his innovative patent highlight his role as a significant inventor. His work not only advances scientific understanding but also paves the way for future innovations in measurement systems.