Yunnan, China

Yingchi Mao


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Yingchi Mao: Innovator in Concrete Dam Defect Analysis

Introduction

Yingchi Mao is a prominent inventor based in Yunnan, China. He has made significant contributions to the field of image processing, particularly in the analysis of concrete dam defects. His innovative approach utilizes advanced neural network techniques to enhance the accuracy and efficiency of defect description generation.

Latest Patents

Yingchi Mao holds a patent for an "Automatic concrete dam defect image description generation method based on graph attention network." This invention involves several key steps: first, it extracts local grid features and whole image features of the defect image using a multi-layer convolutional neural network. Next, it constructs a grid feature interaction graph to fuse and encode the grid visual features and global image features of the defect image. The method then updates and optimizes these features through a graph attention network, allowing for improved visual feature utilization in defect description. This innovative approach captures both global image information and the potential interactions of local grid features, resulting in accurate and coherent defect information descriptions.

Career Highlights

Throughout his career, Yingchi Mao has worked with notable organizations, including Huaneng Lancang River Hydropower Inc. and Hohai University. His experience in these institutions has allowed him to apply his expertise in practical settings, contributing to advancements in hydropower and engineering.

Collaborations

Yingchi Mao has collaborated with esteemed colleagues such as Hua Zhou and Fudong Chi. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Yingchi Mao's contributions to the field of concrete dam defect analysis through his patented methods demonstrate his commitment to innovation and excellence. His work not only enhances the understanding of defect characteristics but also paves the way for future advancements in image processing technologies.

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