Changhua County, Taiwan

Yi-De Liou

USPTO Granted Patents = 2 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:

goldMedal1 out of 832,680 
Other
 patents
where one patent can have more than one assignee

Years Active: 2023

where 'Filed Patents' based on already Granted Patents

2 patents (USPTO):

Title: Yi-De Liou: Innovator in Nanoscale Detection Technologies

Introduction

Yi-De Liou is a prominent inventor based in Changhua County, Taiwan. He has made significant contributions to the field of nanoscale detection technologies, holding a total of 2 patents. His innovative methods have the potential to advance various applications in material science and engineering.

Latest Patents

One of Yi-De Liou's latest patents is a "Method for detecting mechanical and magnetic features with nanoscale resolution." This method involves aiming a probe at a sample, defining several detected points, and applying a predetermined force to gather data on mechanical and magnetic features. The process includes using a signal decomposition algorithm to transform the collected data into multiple data groups, which helps in understanding the feature distributions of the sample.

Another significant patent is the "Magnetic distribution detection method." This method utilizes a magnetic sensor to sense multiple measuring points on a sample. It involves obtaining sense data and the heights of the magnetic sensor from each point, converting this data into groups, and selecting one group as the magnetic distribution data of the sample. These patents showcase Yi-De Liou's expertise in developing advanced detection techniques.

Career Highlights

Throughout his career, Yi-De Liou has demonstrated a commitment to innovation and research. His work has not only contributed to the scientific community but has also paved the way for practical applications in various industries. His dedication to advancing technology is evident in his patent filings and research endeavors.

Collaborations

Yi-De Liou has collaborated with notable colleagues, including Yi-Chun Chen and Guo-Wei Huang. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and enhances the quality of their research.

Conclusion

Yi-De Liou is a distinguished inventor whose work in nanoscale detection technologies has made a significant impact. His innovative patents reflect his expertise and dedication to advancing the field. As he continues to develop new methods, his contributions will undoubtedly influence future research and applications.

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