Ye Su

Title: Ye Su - Innovator in Product Defect Detection

Introduction

Ye Su is a prominent inventor based in Beijing, China. He has made significant contributions to the field of product defect detection, holding a total of 2 patents. His innovative methods and apparatuses are designed to enhance the accuracy and efficiency of defect detection in various products.

Latest Patents

Ye Su's latest patents include a product defect detection method and apparatus, as well as a method and apparatus for outputting information. The product defect detection method involves acquiring a multi-channel image of a target product and inputting it into a defect detection model. This model utilizes multiple convolutional branches, a merging module, and a convolutional head branch to perform feature extraction and determine defect information based on the processed data. The second patent focuses on acquiring an image of a to-be-inspected object, segmenting it into subimages, and using a pre-trained defect classification model to output defect information based on the identified categories.

Career Highlights

Ye Su has worked with notable companies, including Beijing Baidu Netcom Science and Technology Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to advancements in technology related to defect detection.

Collaborations

Throughout his career, Ye Su has collaborated with talented individuals such as Yawei Wen and Jiabing Leng. These partnerships have fostered innovation and the development of cutting-edge solutions in the field.

Conclusion

Ye Su's work in product defect detection showcases his commitment to innovation and excellence. His patents reflect a deep understanding of technology and a drive to improve product quality through advanced detection methods.