Yau-Shing Lee

Title: Yau-Shing Lee: Innovator in Dynamic Hardness Testing

Introduction

Yau-Shing Lee is a notable inventor based in Troy, NY (US). He has made significant contributions to the field of material testing, particularly in the area of dynamic hardness measurement. His innovative approach has implications for various applications, including sporting equipment.

Latest Patents

Yau-Shing Lee holds a patent for a method and apparatus titled "Dynamic hardness testing using measurement of the scarton dynamic." This invention provides a novel way to determine the degree of dynamic hardness of materials. The method involves impulsively exciting a surface of the material by impacting it against a second, relatively hard surface that is in contact with a force-measuring device. The signal from the force-measuring device is then analyzed to determine a frequency-dependent spectrum of the force exerted by the excited surface. From this data, a roll-off frequency is measured and analyzed to ascertain the dynamic hardness of the material. He has 1 patent to his name.

Career Highlights

Yau-Shing Lee is affiliated with Rensselaer Polytechnic Institute, where he continues to engage in research and development in material science. His work has garnered attention for its practical applications and innovative methodologies.

Collaborations

Some of his notable coworkers include Henry August Scarton and Peter A Giacobbe, who have contributed to his research endeavors.

Conclusion

Yau-Shing Lee's contributions to dynamic hardness testing exemplify the importance of innovation in material science. His work not only advances the field but also enhances the performance and safety of various products.