Company Filing History:
Years Active: 1996-1999
Title: Innovations by Yasushi Hiruma in Semiconductor Device Inspection
Introduction
Yasushi Hiruma is a notable inventor based in Hamamatsu, Japan. He has made significant contributions to the field of semiconductor device inspection, holding 2 patents that enhance the accuracy and operability of inspection systems.
Latest Patents
Hiruma's latest patents focus on advanced semiconductor device inspection systems. One of his inventions relates to a system that transparently captures images of the inside of a semiconductor device to analyze anomalous occurrences. This system utilizes infrared ray illumination to obtain image data, which is then processed to create left-to-right reversed images. The system can detect very weak light emitted from anomalous portions of the device when biased, allowing for precise identification of issues. The superimposition of these images enables a clear display of anomalies against the chip patterns of the semiconductor device.
Career Highlights
Hiruma is currently employed at Hamamatsu Photonics K.K., where he continues to innovate in the field of optical technologies. His work has significantly improved the measurement accuracy of semiconductor inspections, making it easier for engineers to identify and address potential problems.
Collaborations
Some of his notable coworkers include Eiji Inuzuka and Shigehisa Oguri, who have collaborated with him on various projects related to semiconductor technology.
Conclusion
Yasushi Hiruma's contributions to semiconductor device inspection systems demonstrate his commitment to advancing technology in this critical field. His innovative patents reflect a deep understanding of the challenges faced in semiconductor analysis and provide effective solutions for the industry.