Company Filing History:
Years Active: 2004
Title: Yasunari Nagaike: Innovator in Surface Measurement Technology
Introduction
Yasunari Nagaike is a notable inventor based in Hachioji, Japan. He has made significant contributions to the field of measurement technology, particularly with his innovative apparatus for measuring surface profiles. His work is recognized for its precision and effectiveness in various applications.
Latest Patents
Nagaike holds a patent for an "Apparatus for measuring a surface profile." This apparatus includes a measuring probe that contacts the surface of the object to be measured. It features a guide mechanism that supports and guides the measuring probe in an axial direction. Additionally, it has a tilt angle adjustment mechanism that allows for tilting the guide mechanism at a predetermined angle. This ensures that the measuring probe contacts the surface with a specific contact force. The drive mechanism enables relative movement between the measuring probe and the object, allowing for a thorough scan of the surface. Nagaike's patent is a testament to his innovative approach to solving complex measurement challenges. He has 1 patent to his name.
Career Highlights
Yasunari Nagaike is associated with Olympus Corporation, a company renowned for its advancements in optical and imaging technology. His role at Olympus has allowed him to work on cutting-edge projects that enhance measurement techniques. His expertise in this area has contributed to the company's reputation for innovation.
Collaborations
Nagaike collaborates with Yoshiaki Ito, a fellow innovator at Olympus Corporation. Their partnership has fostered a creative environment that encourages the development of new technologies and solutions in measurement.
Conclusion
Yasunari Nagaike is a distinguished inventor whose work in surface measurement technology has made a significant impact. His innovative apparatus and collaboration with talented colleagues continue to drive advancements in the field. His contributions are essential for the ongoing evolution of measurement techniques.