Location History:
- Hiroshima, JP (1994)
- Mino, JP (2000)
Company Filing History:
Years Active: 1994-2000
Title: Yasuhiro Sugawara: Innovator in Scanning Probe Microscopy
Introduction
Yasuhiro Sugawara is a prominent inventor based in Mino, Japan. He has made significant contributions to the field of microscopy, particularly through his innovative designs in scanning probe technology. With a total of 2 patents, Sugawara continues to push the boundaries of scientific exploration.
Latest Patents
Sugawara's latest patents include advancements in scanning probe microscopes. One of his notable inventions features a conductive cantilever with a probe supported by a piezoelectric element. This design allows for oscillation upon receiving an AC voltage, enabling precise measurements of surface potential and configuration data. Another patent focuses on a scanning probe microscope that includes a cantilever with a conductive probe positioned near a sample. This invention utilizes various circuits to apply bias voltage, detect tunnel currents, and form STS, STM, and AFM image data simultaneously.
Career Highlights
Yasuhiro Sugawara is currently associated with Olympus Optical Company, Ltd., where he applies his expertise in developing advanced microscopy technologies. His work has significantly enhanced the capabilities of scanning probe microscopy, making it an essential tool in various scientific fields.
Collaborations
Sugawara has collaborated with notable colleagues, including Seizo Morita and Takao Okada. These partnerships have fostered innovation and contributed to the advancement of microscopy technologies.
Conclusion
Yasuhiro Sugawara's contributions to scanning probe microscopy exemplify his dedication to innovation in scientific research. His patents reflect a commitment to enhancing measurement techniques, which will undoubtedly influence future developments in the field.