Company Filing History:
Years Active: 2015
Title: Yang Yi - Innovator in Memory Testing Technology
Introduction
Yang Yi is a prominent inventor based in Allen, Texas. He has made significant contributions to the field of integrated circuit testing, particularly in the area of static random access memories. His innovative approach has led to advancements that enhance the reliability and efficiency of memory arrays.
Latest Patents
Yang Yi holds a patent for a method titled "Functional screening of static random access memories using an array bias voltage." This patent describes a method for testing large-scale integrated circuits that include multiple instances of memory arrays. The invention focuses on determining voltage drops due to parasitic resistance in array bias conductors by extracting layout parameters. It also involves circuit simulation to derive voltage drops during the operation of each memory array. Additionally, the method allows for the selective connection of sense lines from each memory array to a test sense terminal, enabling external measurement of the array bias voltage. Feedback control can be applied to achieve the desired array bias voltage.
Career Highlights
Yang Yi is currently employed at Texas Instruments Corporation, a leading company in semiconductor design and manufacturing. His work at Texas Instruments has positioned him as a key player in the development of advanced memory testing technologies.
Collaborations
Yang has collaborated with notable colleagues, including Xiaowei Deng and Wah Kit Loh, who have contributed to his research and development efforts in the field of integrated circuits.
Conclusion
Yang Yi's innovative work in memory testing technology exemplifies the impact of dedicated inventors in advancing the field of electronics. His contributions continue to shape the future of integrated circuit design and testing.