Company Filing History:
Years Active: 2025
Title: Innovations of Xingyuan Lu in Optical Measurement
Introduction
Xingyuan Lu is a prominent inventor based in Suzhou, China. He has made significant contributions to the field of optical measurement, particularly in the area of fractional vortex beams. His innovative work has led to the development of advanced methods for measuring topological charges in optical fields.
Latest Patents
Xingyuan Lu holds a patent titled "Method and apparatus for measuring topological charge of partially coherent fractional vortex beam." This invention involves a partially coherent fractional vortex beam passing through a scattering object. An optimization algorithm is utilized to minimize the error between measurable information and the information to be measured. The main electric field mode and weight of the fractional vortex beam are reconstructed using a multimode stacked diffraction algorithm. The process includes calculating a cross-spectral density function of the beam and reconstructing the optical field to obtain complete information, including light intensity and phase. This method allows for accurate topological charge measurement of the fractional vortex beam under low coherence conditions.
Career Highlights
Xingyuan Lu is affiliated with Soochow University, where he continues to engage in research and development in optical technologies. His work has garnered attention for its practical applications in various scientific fields.
Collaborations
Xingyuan Lu has collaborated with notable colleagues, including Zhuoyi Wang and Chengliang Zhao. Their joint efforts have contributed to advancements in optical measurement techniques.
Conclusion
Xingyuan Lu's innovative contributions to the field of optical measurement demonstrate his expertise and commitment to advancing technology. His patent on measuring topological charges in fractional vortex beams is a testament to his significant impact in this area.