Xinglai Ge

Title: Innovations of Xinglai Ge in Junction Temperature Monitoring

Introduction

Xinglai Ge is a notable inventor based in Chengdu, China. He has made significant contributions to the field of electrical engineering, particularly in the area of junction temperature monitoring. His innovative approach has led to the development of a unique measurement circuit that enhances the accuracy of temperature monitoring in electronic devices.

Latest Patents

Xinglai Ge holds a patent for a "Resistor voltage-bearing type on-state voltage drop measurement circuit for junction temperature monitoring and monitoring method." This invention discloses a measurement circuit that includes a high-resistance series high-voltage resistor, switching diodes, a low-voltage MOSFET, and various other components. The monitoring method involves designing an on-state voltage drop sampling circuit based on the high-resistance resistor and selecting parameters according to actual application scenarios. It also includes measuring collector current and on-state voltage drop models at different junction temperatures, providing a calculation model for online monitoring.

Career Highlights

Xinglai Ge is affiliated with Southwest Jiaotong University, where he continues to contribute to research and development in electrical engineering. His work focuses on improving the efficiency and reliability of electronic components through innovative measurement techniques.

Collaborations

Xinglai Ge has collaborated with notable colleagues such as Wensheng Song and Haoyang Tan. Their combined expertise has further advanced the research and applications of temperature monitoring technologies.

Conclusion

Xinglai Ge's contributions to junction temperature monitoring through his patented inventions demonstrate his commitment to innovation in electrical engineering. His work not only enhances the performance of electronic devices but also sets a foundation for future advancements in the field.