Shanghai, China

Xiaofeng Xia

This inventor holds 1 USPTO granted patent. Top assignee: Shanghai Huali Microelectronics Corporation. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiaofeng Xia. Retrieved from https://idiyas.com/inventor/xiaofeng-xia-dkvcqucn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations of Xiaofeng Xia in CMOS Image Sensor Technology

Introduction

Xiaofeng Xia is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of semiconductor technology, particularly in the development of CMOS image sensors. His innovative approaches have led to advancements that enhance device performance and reduce electrical crosstalk.

Latest Patents

Xiaofeng Xia holds a patent for a "Method for manufacturing deep trench isolation grid structure." This patent describes a process that involves depositing multiple isolation layers within deep trenches to create a grid structure. The method effectively reduces electrical crosstalk between adjacent grid lines, thereby improving the overall performance of CMOS image sensors.

Career Highlights

Xiaofeng Xia is associated with Shanghai Huali Microelectronics Corporation, where he applies his expertise in semiconductor manufacturing. His work focuses on enhancing the functionality and efficiency of image sensors, which are critical components in various electronic devices.

Collaborations

Xiaofeng collaborates with Xiang Peng, a fellow innovator in the field. Together, they work on projects that aim to push the boundaries of semiconductor technology and improve imaging solutions.

Conclusion

Xiaofeng Xia's contributions to the field of CMOS image sensors exemplify the impact of innovative thinking in technology. His patented methods and collaborative efforts continue to drive advancements in semiconductor manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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