Company Filing History:
Years Active: 1996
Title: Wun Mu-Tung: Innovator in Photo-Electric Feedback Compensation Technology
Introduction
Wun Mu-Tung is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of photo-electric technology, particularly through his innovative patent that enhances the functionality of charged coupled device (CCD) scanners. His work exemplifies the intersection of engineering and practical application in modern technology.
Latest Patents
Wun Mu-Tung holds a patent for a "Photo Electric Feedback Compensation Controlled Apparatus." This apparatus is designed to optimize the performance of CCD scanners by automatically adjusting the output intensity of a light source based on real-time feedback from the CCD. The system utilizes a voltage-controlled power supply to manage the light emitted through an optical system, ensuring that the CCD scanner operates within its optimal range. This innovation not only improves the signal-to-noise (S/N) ratio but also eliminates the need for manual adjustments, making it a valuable advancement in the field.
Career Highlights
Throughout his career, Wun Mu-Tung has been associated with Umax Data System Inc., where he has contributed to various projects that leverage his expertise in photo-electric technology. His work has been instrumental in developing solutions that address the challenges faced by CCD scanners in different environments and conditions.
Collaborations
Wun Mu-Tung has collaborated with Shih-Chung Chang, a fellow innovator, to further enhance the capabilities of their technological developments. Their partnership has fostered a creative environment that encourages the exploration of new ideas and solutions in the field of photo-electric technology.
Conclusion
Wun Mu-Tung's contributions to the field of photo-electric feedback compensation technology highlight his innovative spirit and dedication to improving technological applications. His patent serves as a testament to the impact of his work on the efficiency and effectiveness of CCD scanners.