Woo Jung Ahn

Title: Woo Jung Ahn: Innovator in Non-Contact Measuring Technology

Introduction

Woo Jung Ahn is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of measurement technology, particularly through his innovative patent. His work focuses on non-contact methods for measuring three-dimensional micro patterns, which has applications in various industries.

Latest Patents

Woo Jung Ahn holds a patent for a non-contact measuring method for three-dimensional micro patterns. This method utilizes the blur of light to measure the surface of a measuring object. An optical window with a slit is positioned between the light source and the measuring object to facilitate this process. The blurred image is captured by a charge-coupled device sensor-based image frame grabber and analyzed using personal computers. The method allows for the calculation of relative height differences across the scanning measurement area, providing precise measurements without physical contact.

Career Highlights

Throughout his career, Woo Jung Ahn has demonstrated a commitment to advancing measurement technologies. His innovative approach to non-contact measurement has positioned him as a leader in this niche field. His patent reflects his expertise and dedication to improving measurement accuracy and efficiency.

Collaborations

Woo Jung Ahn has collaborated with notable colleagues, including Heui Jae Pahk and Sung Wook Cho. These partnerships have contributed to the development and refinement of his innovative measuring techniques.

Conclusion

Woo Jung Ahn's contributions to non-contact measuring technology highlight his role as a significant inventor in the field. His patented method showcases the potential for advancements in measurement accuracy and efficiency. His work continues to influence the industry and inspire future innovations.