Company Filing History:
Years Active: 2017
Title: Wolfgang Gigerl: Innovator in Sample Analysis Technology
Introduction
Wolfgang Gigerl is a notable inventor based in Eibiswald, Austria. He has made significant contributions to the field of sample analysis technology. His innovative approach has led to the development of a unique method and apparatus that enhances the examination of samples using radiation.
Latest Patents
Wolfgang Gigerl holds a patent for a "Method and apparatus for analysis of samples." This invention involves a method and device that examines a sample with radiation emitted from a radiation source. The radiation is directed to the sample via a beamforming unit and detected by a detector, which is then evaluated in an evaluating unit. Prior to the examination, various components, including the radiation source, beamforming unit, sample holder, detector, and a primary beam stop, are spatially oriented and positioned in relation to each other and a predefined fixed point. This is achieved through a control unit and actuating drives. The radiation intensity measured by the detector is used to establish a control variable that is conferred from the control unit to the actuating drives assigned to the components.
Career Highlights
Wolfgang Gigerl is associated with Anton Paar GmbH, a company known for its high-precision measurement and analysis instruments. His work at Anton Paar has allowed him to focus on advancing technologies that improve sample analysis processes.
Collaborations
Wolfgang has collaborated with notable colleagues, including Heimo Schnablegger and Josef Gautsch. Their teamwork has contributed to the successful development of innovative solutions in their field.
Conclusion
Wolfgang Gigerl's contributions to sample analysis technology exemplify the impact of innovation in scientific research. His patent and work at Anton Paar GmbH highlight his commitment to advancing analytical methods.